96年上學期 電子顯微鏡學

星期五 上午09:10-12:10 工綜228室

Office E-mail
Instructor 薛景中 中研院應科中心P215 shyue at gate.sinica.edu.tw
TA 吳馥馨 工綜236室 fxwu at ntu.edu.tw
Textbook D. B. Williams and C. B. Carter: Transmission Electron Microscopy
Plenum Press, New York, 1996 Paperback, 4 Volumes
Website http://www.shyue.idv.tw/teaching.html
Workload Homework 4 in total 10% each 40%
Mid-term exam 30% 30%
Final exam 30% 30%
Total* 100%
* If the final class average falls below 70%, a curved scale will be used, with the class average set at or near 78%.

Homework policies:

Homework will be due in class at the second class meeting after it is assigned. Late homework will be subject to a penalty of 10% per day unless an extension has been arranged with the instructor prior to the due date. No late homework will be accepted after a solution set has been made available.
Homework must be legible, with questions answered in numerical order, and stapled if more than one page long. Please: no spiral-bound paper, or pages connected by folding the corners. Students may consult with one another on the homework, but what is handed in must be each student's original, individual work. Homework assignments (or portions thereof) from different students that appear to have been copied or that otherwise appear to be identical may be returned to all the submitters with zero credit.
The purpose of the homework is to illustrate, apply, and reinforce key topics, not to serve as dry runs for the tests.

Tests and Exams:

Students may bring pencils or pens, erasers, and straight edges to the tests. The tests and final exam will be closed-book, closed-notes. No formula sheets or any other forms of stored information are permitted. Each test will cover the lectures and reading assignments from the preceding third of the course. The final exam will cover material from throughout the course. Some of the test questions will be similar to the homework problems in style (i.e., short-answer; calculations; explanations of concepts), but some questions will require the student to apply previous material to new situations.

Syllabus

Lecture topics, readings, and dates of homework assignments are subject to change. Tests will cover the lecture content and the reading assignments.
Week Date Lecture Topic Homework
1 2/26 Introduction [quicktime version]
slides updated on 07/09/21
2 3/5 Instrumentation and Sample Preparation [quicktime version]
slides updated on 10/02/22
3 3/12 Electron-Atom Interactions [quicktime version]
slides updated on 10/02/24
4 3/19 Scanning Electron Mucriscopy [quicktime version]
slides updated on 10/02/24
#1 assigned
5 3/26 Electron Probe Microanalysis (EPMA) [quicktime version]
slides updated on 10/02/24
#1 due
6 4/2 Diffraction [quicktime version]
slides updated on 07/09/21
7 4/9 Diffraction Patterns [quicktime version]
slides updated on 08/12/04
#2 asigned
8 4/16 Review and Discussion #2 due
9 4/23 Mid-term exam
10 4/30 Contrast and Imaging [quicktime version]
slides updated on 10/04/29
11 5/7 Imaging Defects [quicktime version]
slides updated on 07/09/21
12 5/14 High-Resolution TEM [quicktime version]
slides updated on 07/09/21
13 5/21 Simulation [quicktime version]
slides updated on 07/09/21
#3 assigned
14 5/28 Analytical TEM (XEDS and EELS) [quicktime version]
slides updated on 10/04/29
#3 due
15 6/4 Energy Filtered TEM [quicktime version]
slides updated on 10/04/29
16 6/11 Scanning TEM [quicktime version] and special topics [quicktime version]
slides updated on 10/02/22
#4 assigned
17 6/18 Review and Discussion #4 due
18 1/15 Final Exam